The International Conference on Optical Characterization of Materials (OCM-2015) is organized by the Karlsruhe Center for Spectral Signatures of Materials (KCM) in cooperation with the German Chapter of the Instrumentation & Measurement Society of IEEE. KCM is an association of instituts of the Karlsruhe Institute for Technology (KIT) and the business unit Automated Visual Inspection of the Fraunhofer Institute of Optronics, System Technologies and Image Exploitation IOSB.
March 17. 2015,
17-20h you welcome:
Summary of the SpectroNet Collaboration Forum and transfer to
the OCM 2015 with a special issue presentation:
UTILIZATION OF SPECTRAL SIGNATURES OF FOOD FOR DAILY USE.
More information on the OCM 2015, we are a member of the SpectroNet International Collaboration Cluster.